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DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—With wide applicability of flash memory in various application domains, reliability has become a very critical issue. This research is motivated by the needs to resolve the lif...
DSN
2009
IEEE
2009
IEEE
Processor reliability enhancement through compiler-directed register file peak temperature reduction
13 years 8 months ago
Each semiconductor technology generation brings us closer to the imminent processor architecture heat wall, with all its associated adverse effects on system performance and reliab...