2 search results - page 1 / 1 » A skew polynomial approach to integro-differential operators |
ISSAC
2009
Springer
13 years 12 months ago
2009
Springer
ASPDAC
2008
ACM
13 years 7 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...