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DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
More and more the system verification makes use of hardware emulation techniques that allow a speed up in simulation performance up to thousand times. Typically, a design is comp...
VLSID
2008
IEEE
13 years 11 months ago
2008
IEEE
— Testing non volatile memories for tunnel oxide defects is one of the most important aspects to guarantee cell reliability. Defective tunnel oxide layer in core memory cells can...
PVLDB
2008
13 years 4 months ago
2008
Our previous work has shown that architectural and application shifts have resulted in modern OLTP databases increasingly falling short of optimal performance [10]. In particular,...
ASPLOS
2012
ACM
12 years 17 days ago
2012
ACM
Emerging fast, non-volatile memories (e.g., phase change memories, spin-torque MRAMs, and the memristor) reduce storage access latencies by an order of magnitude compared to state...
HPCA
2001
IEEE
14 years 5 months ago
2001
IEEE
A new memory subsystem called Memory Expansion Technology (MXT) has been built for compressing main memory contents. MXT effectively doubles the physically available memory. This ...