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DAC
2000
ACM
13 years 9 months ago
An asymptotically constant, linearly bounded methodology for the statistical simulation of analog circuits including component m
Abstract: This paper presents a new statistical methodology to simulate the effect of both inter-die and intra-die variation on the electrical performance of analog integrated circ...
Carlo Guardiani, Sharad Saxena, Patrick McNamara, ...
DATE
2002
IEEE
126views Hardware» more  DATE 2002»
13 years 9 months ago
Automated Modeling of Custom Digital Circuits for Test
Models meant for logic verification and simulation are often used for ATPG. For custom digital circuits, these models contain many tristate devices, which leads to lower fault co...
Soumitra Bose