13 search results - page 3 / 3 » A unified non-rectangular device and circuit simulation mode... |
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
Predictive delay analysis is presented for a representative CMOS inverter with submicron device size using PREDICTMOS MOSFET model. As against SPICE, which adopts a time consuming...