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ICCAD
2004
IEEE
14 years 1 months ago
2004
IEEE
— In deep sub-micron technologies, process variations can cause significant path delay and clock skew uncertainties thereby lead to timing failure and yield loss. In this paper,...
ICCAD
2007
IEEE
14 years 1 months ago
2007
IEEE
— As technology scales, the delay uncertainty caused by process variations has become increasingly pronounced in deep submicron designs. As a result, a paradigm shift from determ...