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IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
13 years 10 months ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
ISQED
2007
IEEE
148views Hardware» more  ISQED 2007»
13 years 10 months ago
On Accelerating Soft-Error Detection by Targeted Pattern Generation
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
DAC
2006
ACM
14 years 5 months ago
MARS-C: modeling and reduction of soft errors in combinational circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
Natasa Miskov-Zivanov, Diana Marculescu
COGSCI
2004
81views more  COGSCI 2004»
13 years 4 months ago
Soft constraints in interactive behavior: the case of ignoring perfect knowledge in-the-world for imperfect knowledge in-the-hea
Constraints and dependencies among the elements of embodied cognition form patterns or microstrategies of interactive behavior. Hard constraints determine which microstrategies ar...
Wayne D. Gray, Wai-Tat Fu
CHI
2001
ACM
14 years 4 months ago
Ignoring perfect knowledge in-the-world for imperfect knowledge in-the-head
Constraints and dependencies among the elements of embodied cognition form patterns or microstrategies of interactive behavior. Hard constraints determine which microstrategies ar...
Wayne D. Gray, Wai-Tat Fu