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IOLTS   2007 IEEE International On-Line Testing Symposium
Wall of Fame | Most Viewed IOLTS-2007 Paper
IOLTS
2007
IEEE
155views Hardware» more  IOLTS 2007»
9 years 8 months ago
On Derating Soft Error Probability Based on Strength Filtering
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
Alodeep Sanyal, Sandip Kundu
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