167 search results - page 1 / 34 » Accounting for defect characteristics in evaluations of test... |
TOSEM
2012
11 years 7 months ago
2012
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Multiple-detect test sets have been shown to be effective in lowering defect level. Other researchers have noted that observing the effects of a defect can be controlled by sensit...
IRI
2007
IEEE
13 years 11 months ago
2007
IEEE
We present a software defect prediction model using operating characteristic curves. The main idea behind our proposed technique is to use geometric insight in helping construct a...
ITC
1995
IEEE
13 years 8 months ago
1995
IEEE
This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and tes...
VTS
2006
IEEE
13 years 11 months ago
2006
IEEE
A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measu...