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ITC   2003 International Test Conference
Wall of Fame | Most Viewed ITC-2003 Paper
ITC
2003
IEEE
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9 years 3 months ago
Case Study - Using STIL as Test Pattern Language
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...
Daniel Fan, Steve Roehling, Rusty Carruth
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