167 search results - page 2 / 34 » Accounting for defect characteristics in evaluations of test... |
ICSE
2005
IEEE-ACM
14 years 5 months ago
2005
IEEE-ACM
Some software defects trigger failures only when certain complex information flows occur within the software. Profiling and analyzing such flows therefore provides a potentially i...
VTS
2005
IEEE
13 years 11 months ago
2005
IEEE
The power supply transient signal (IDDT) method that we propose for defect detection analyze regional signal variations introduced by defects at a set of power supply pads on the ...
CORR
2010
Springer
13 years 5 months ago
2010
Springer
This paper develops automated testing and debugging techniques for answer set solver development. We describe a flexible grammar-based black-box ASP fuzz testing tool which is abl...
SIGSOFT
2004
ACM
14 years 6 months ago
2004
ACM
Defect-occurrence projection is necessary for the development of methods to mitigate the risks of software defect occurrences. In this paper, we examine user-reported software def...
MICRO
2007
IEEE
13 years 11 months ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...