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» Acyclic circuit partitioning for path delay fault emulation
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AICCSA
2005
IEEE
111views Hardware» more  AICCSA 2005»
13 years 10 months ago
Acyclic circuit partitioning for path delay fault emulation
Fatih Kocan, Mehmet Hadi Gunes
ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
13 years 9 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...
DAC
1994
ACM
13 years 9 months ago
Clock Grouping: A Low Cost DFT Methodology for Delay Testing
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
Wen-Chang Fang, Sandeep K. Gupta
EAAI
2007
103views more  EAAI 2007»
13 years 4 months ago
Particle swarm-based optimal partitioning algorithm for combinational CMOS circuits
This paper presents a swarm intelligence based approach to optimally partition combinational CMOS circuits for pseudoexhaustive testing. The partitioning algorithm ensures reducti...
Ganesh K. Venayagamoorthy, Scott C. Smith, Gaurav ...
FPGA
1998
ACM
142views FPGA» more  FPGA 1998»
13 years 9 months ago
A Hybrid Complete-Graph Partial-Crossbar Routing Architecture for Multi-FPGA Systems
Multi-FPGA systems (MFSs) are used as custom computing machines, logic emulators and rapid prototyping vehicles. A key aspect of these systems is their programmable routing archit...
Mohammed A. S. Khalid, Jonathan Rose