11 search results - page 1 / 3 » Adaptive Debug and Diagnosis without Fault Dictionaries |
ETS
2007
IEEE
13 years 11 months ago
2007
IEEE
ASPDAC
2001
ACM
13 years 8 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
ICCBR
2003
Springer
13 years 10 months ago
2003
Springer
Abstract. There have been some Artificial Intelligence applications developed for electronic circuits diagnosis, but much remains to be done in this field, above all in the analo...
PLDI
2005
ACM
13 years 10 months ago
2005
ACM
Faults that occur in production systems are the most important faults to fix, but most production systems lack the debugging facilities present in development environments. TraceB...
ETS
2009
IEEE
13 years 2 months ago
2009
IEEE
We optimize the full-response diagnostic fault dictionary from a given test set. The smallest set of vectors is selected without loss of diagnostic resolution of the given test se...