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ASAP
2008
IEEE
142views Hardware» more  ASAP 2008»
13 years 11 months ago
Managing multi-core soft-error reliability through utility-driven cross domain optimization
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
Wangyuan Zhang, Tao Li
ISCA
2010
IEEE
222views Hardware» more  ISCA 2010»
13 years 6 months ago
Cohesion: a hybrid memory model for accelerators
Two broad classes of memory models are available today: models with hardware cache coherence, used in conventional chip multiprocessors, and models that rely upon software to mana...
John H. Kelm, Daniel R. Johnson, William Tuohy, St...