15 search results - page 1 / 3 » Address and Data Scrambling: Causes and Impact on Memory Tes... |
DELTA
2002
IEEE
13 years 9 months ago
2002
IEEE
: The way address sequences and data patterns appear on the outside of a memory may differ from their internal appearance; this effect is referred to as scrambling, which has a lar...
ISCA
1995
IEEE
13 years 8 months ago
1995
IEEE
For many programs, especially integer codes, untolerated load instruction latencies account for a significant portion of total execution time. In this paper, we present the desig...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
ICBA
2004
Springer
13 years 10 months ago
2004
Springer
The 9/11 tragedy triggered an increased interest in biometric passports. According to several sources [2], the electronic ID market is expected to increase by more than 50% per ann...
IWMM
2011
Springer
12 years 7 months ago
2011
Springer
To achieve optimal performance, garbage-collected applications must balance the sizes of their heaps dynamically. Sizing the heap too small can reduce throughput by increasing the...