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DATE
2009
IEEE
88views Hardware» more  DATE 2009»
13 years 9 months ago
A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
Xiao Liu, Qiang Xu
EUROSYS
2011
ACM
12 years 8 months ago
SRM-buffer: an OS buffer management technique to prevent last level cache from thrashing in multicores
Buffer caches in operating systems keep active file blocks in memory to reduce disk accesses. Related studies have been focused on how to minimize buffer misses and the caused pe...
Xiaoning Ding, Kaibo Wang, Xiaodong Zhang
IPSN
2007
Springer
13 years 11 months ago
Harbor: software-based memory protection for sensor nodes
Many sensor nodes contain resource constrained microcontrollers where user level applications, operating system components, and device drivers share a single address space with no...
Ram Kumar, Eddie Kohler, Mani B. Srivastava
IPPS
2003
IEEE
13 years 10 months ago
Using Incorrect Speculation to Prefetch Data in a Concurrent Multithreaded Processor
Concurrent multithreaded architectures exploit both instruction-level and thread-level parallelism through a combination of branch prediction and thread-level control speculation. ...
Ying Chen, Resit Sendag, David J. Lilja
ICSE
2008
IEEE-ACM
14 years 6 months ago
Testing pervasive software in the presence of context inconsistency resolution services
Pervasive computing software adapts its behavior according to the changing contexts. Nevertheless, contexts are often noisy. Context inconsistency resolution provides a cleaner pe...
Heng Lu, W. K. Chan, T. H. Tse