33 search results - page 1 / 7 » An Efficient Dynamic Parallel Approach to Automatic Test Pat... |
GLVLSI
1997
IEEE
13 years 9 months ago
1997
IEEE
MIDDLEWARE
2009
Springer
13 years 10 months ago
2009
Springer
Abstract. The performance of multi-tier systems is known to be significantly degraded by workloads that place bursty service demands on system resources. Burstiness can cause queu...
EURODAC
1990
IEEE
13 years 9 months ago
1990
IEEE
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
ICS
1994
Tsinghua U.
13 years 9 months ago
1994
Tsinghua U.
We present a parallel code generation algorithm for complete applications and a new experimental methodology that tests the efficacy of our approach. The algorithm optimizes for d...
COR
2008
2008
Observations in using parallel and sequential evolutionary algorithms for automatic software testing
13 years 5 months ago
In this paper we analyze the application of parallel and sequential evolutionary algorithms (EAs) to the automatic test data generation problem. The problem consists of automatica...