Reconfigurable architectures are becoming increasingly popular with space related design engineers as they are inherently flexible to meet multiple requirements and offer signific...
This paper presents a unique SEU (single Event Upset) mitigation technique based upon Temporal Data Sampling for synchronous circuits and configuration bit storage for programmabl...
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects. In particular, single event upsets, such as soft errors, and hard faults are ...
Dongkook Park, Chrysostomos Nicopoulos, Jongman Ki...