48 search results - page 2 / 10 » An Embedded IDDQ Testing Architecture and Technique |
ICCAD
2009
IEEE
13 years 3 months ago
2009
IEEE
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
SERA
2005
Springer
13 years 11 months ago
2005
Springer
In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for n...
DFT
2004
IEEE
13 years 9 months ago
2004
IEEE
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
BIRTHDAY
2012
Springer
12 years 1 months ago
2012
Springer
Embedded systems must interact with their real-time environment in a timely and dependable fashion. Most embeddedsystems architectures and design processes consider “nonfunction...
MTDT
2002
IEEE
13 years 10 months ago
2002
IEEE
The amount of memory being embedded on chip is growing rapidly. This strongly implies that memory Built-in-self-test (BIST) logic assumes utmost importance amongst all on chip sel...