99 search results - page 3 / 20 » An Intelligent Approach to Automatic Test Equipment |
APIN
2004
13 years 5 months ago
2004
Companies that provide crane-lorry services are faced with the daily need to perform vehicle and driver allocation and scheduling. Many companies still do this manually due to the ...
DDECS
2007
IEEE
14 years 3 days ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
CEC
2008
IEEE
14 years 7 days ago
2008
IEEE
— Many tasks in Software Engineering are very expensive, and that has led the investigation to how to automate them. In particular, Software Testing can take up to half of the re...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisi...
EPIA
2007
Springer
13 years 9 months ago
2007
Springer
In this paper we present a rule-based system for automatic extraction of definitions from Portuguese texts. As input, this system takes text that is previously annotated with morph...