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IV
2003
IEEE
201views Visualization» more  IV 2003»
13 years 10 months ago
Layout Metrics for Euler Diagrams
An alternative term for these diagrams is “Euler-Venn diagrams” but they are often inaccurately called “Venn diagrams”. Venn diagrams often look similar, but must contain a...
Jean Flower, Peter Rodgers, Paul Mutton
PPOPP
1997
ACM
13 years 9 months ago
Effective Fine-Grain Synchronization for Automatically Parallelized Programs Using Optimistic Synchronization Primitives
As shared-memory multiprocessors become the dominant commodity source of computation, parallelizing compilers must support mainstream computations that manipulate irregular, point...
Martin C. Rinard
CCR
2008
106views more  CCR 2008»
13 years 5 months ago
Message-efficient dissemination for loop-free centralized routing
With steady improvement in the reliability and performance of communication devices, routing instabilities now contribute to many of the remaining service degradations and interru...
Haldane Peterson, Soumya Sen, Jaideep Chandrasheka...
CORR
2008
Springer
139views Education» more  CORR 2008»
13 years 5 months ago
Exact two-terminal reliability of some directed networks
Abstract-- The calculation of network reliability in a probabilistic context has long been an issue of practical and academic importance. Conventional approaches (determination of ...
Christian Tanguy
TC
1998
13 years 5 months ago
Abstraction Techniques for Validation Coverage Analysis and Test Generation
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...