65 search results - page 2 / 13 » An on Chip ADC Test Structure |
ADC
2006
Springer
13 years 11 months ago
2006
Springer
Searching bio-chemical structures is becoming an important application domain of information retrieval. This paper introduces a protein structure matching problem and formulates i...
DAC
2000
ACM
14 years 6 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
DSD
2005
IEEE
13 years 10 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
The main objective of core-based IC design is improvement of design efficiency and time-to-market. In order to prevent test development from becoming the bottleneck in the entire ...
FMCAD
2007
Springer
13 years 11 months ago
2007
Springer
— The concept of applying partial fencing to logic built-in self test (LBIST) hardware structures for the purpose of using partially good chips is well known in the chip design i...