135 search results - page 1 / 27 » Analog circuit test based on a digital signature |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
We present a new approach for TAM optimization and test scheduling in the modular testing of mixed-signal SOCs. A test planning approach for digital SOCs is extended to handle ana...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. ...