85 search results - page 16 / 17 » Analysis and Detection of Timing Failures in an Experimental... |
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
PPOPP
2006
ACM
13 years 11 months ago
2006
ACM
Applications need to become more concurrent to take advantage of the increased computational power provided by chip level multiprocessing. Programmers have traditionally managed t...
OOPSLA
2007
Springer
13 years 11 months ago
2007
Springer
Calling context enhances program understanding and dynamic analyses by providing a rich representation of program location. Compared to imperative programs, objectoriented program...
EICS
2009
ACM
14 years 5 days ago
2009
ACM
This paper evaluates the input performance capabilities of Velocity Threshold (I-VT) and Kalman Filter (I-KF) eye movement detection models when employed for eye-gaze-guided inter...
HPCA
2006
IEEE
14 years 6 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...