85 search results - page 3 / 17 » Analysis and Detection of Timing Failures in an Experimental... |
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
DATE
2008
IEEE
14 years 3 days ago
2008
IEEE
There have been serious concerns recently about the security of microchips from hardware trojan horse insertion during manufacturing. This issue has been raised recently due to ou...
ETS
2006
IEEE
13 years 11 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
WCET
2007
13 years 6 months ago
2007
Memory corruption is one of the most common software failures. For sequential software and multitasking software with synchronized data accesses, it has been shown that program fa...
MICRO
2007
IEEE
13 years 12 months ago
2007
IEEE
Technology scaling, characterized by decreasing feature size, thinning gate oxide, and non-ideal voltage scaling, will become a major hindrance to microprocessor reliability in fu...