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DAC
2008
ACM
14 years 7 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2007
ACM
14 years 7 months ago
Implicitly Parallel Programming Models for Thousand-Core Microprocessors
This paper argues for an implicitly parallel programming model for many-core microprocessors, and provides initial technical approaches towards this goal. In an implicitly paralle...
Wen-mei W. Hwu, Shane Ryoo, Sain-Zee Ueng, John H....
ADBIS
1995
Springer
155views Database» more  ADBIS 1995»
13 years 9 months ago
The MaStA I/O Cost Model and its Validation Strategy
Crash recovery in database systems aims to provide an acceptable level of protection from failure at a given engineering cost. A large number of recovery mechanisms are known, and...
S. Scheuerl, Richard C. H. Connor, Ronald Morrison...
ACSAC
2008
IEEE
14 years 15 days ago
Defending Against Attacks on Main Memory Persistence
Main memory contains transient information for all resident applications. However, if memory chip contents survives power-off, e.g., via freezing DRAM chips, sensitive data such a...
William Enck, Kevin R. B. Butler, Thomas Richardso...
PLDI
2011
ACM
12 years 8 months ago
EnerJ: approximate data types for safe and general low-power computation
Energy is increasingly a first-order concern in computer systems. Exploiting energy-accuracy trade-offs is an attractive choice in applications that can tolerate inaccuracies. Re...
Adrian Sampson, Werner Dietl, Emily Fortuna, Danus...