67 search results - page 1 / 14 » Analysis of multibackground memory testing techniques |
AMCS
2010
13 years 5 months ago
2010
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
: It has always been assumed that fault models in memories are sufficiently precise for specifying the faulty behavior. This means that, given a fault model, it should be possible...
ETS
2007
IEEE
13 years 11 months ago
2007
IEEE
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
SBMF
2009
Springer
13 years 11 months ago
2009
Springer
In today’s information society, flash memory has become a virtually indispensable component, particularly for mobile devices. In order for mobile devices to operate successfully...
HPCA
2006
IEEE
14 years 5 months ago
2006
IEEE
An important means of validating the design of commercial-grade shared memory multiprocessors is to run a large number of pseudo-random test programs on them. However, when intent...