14 search results - page 1 / 3 » Analytical model for TDDB-based performance degradation in c... |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
With aggressive gate oxide scaling, latent defects in the gate oxide manifest as traps that, in time, lead to gate oxide breakdown. Progressive gate oxide breakdown, also referred...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
ICDAR
2005
IEEE
13 years 10 months ago
2005
IEEE
Printing and scanning of text documents introduces degradations to the characters which can be modeled. Interestingly, certain combinations of the parameters that govern the degra...
INFOCOM
2002
IEEE
13 years 9 months ago
2002
IEEE
Abstract— An analytical model is developed for cellular networks with a combined adaptive bandwidth allocation and trafficrestriction mechanism. Instead of focusing only on the ...