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CODES
2006
IEEE
13 years 11 months ago
Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
Antonis Papanikolaou, T. Grabner, Miguel Miranda, ...
CODES
2010
IEEE
13 years 2 months ago
Statistical approach in a system level methodology to deal with process variation
The impact of process variation in state of the art technology makes traditional (worst case) designs unnecessarily pessimistic, which translates to suboptimal designs in terms of...
Concepción Sanz Pineda, Manuel Prieto, Jos&...
KDD
2007
ACM
237views Data Mining» more  KDD 2007»
14 years 5 months ago
Knowledge discovery of multiple-topic document using parametric mixture model with dirichlet prior
Documents, such as those seen on Wikipedia and Folksonomy, have tended to be assigned with multiple topics as a meta-data. Therefore, it is more and more important to analyze a re...
Issei Sato, Hiroshi Nakagawa
ICCAD
2006
IEEE
147views Hardware» more  ICCAD 2006»
14 years 1 months ago
Analysis and modeling of CD variation for statistical static timing
Statistical static timing analysis (SSTA) has become a key method for analyzing the effect of process variation in aggressively scaled CMOS technologies. Much research has focused...
Brian Cline, Kaviraj Chopra, David Blaauw, Yu Cao
GECCO
2004
Springer
183views Optimization» more  GECCO 2004»
13 years 10 months ago
A Novel Immune Feedback Control Algorithm and Its Applications
This paper first analyzes the feedback principle of nature immune system and then the immune process is imitated by virtue of nonlinear molecular dynamics. Then the mathematic mode...
Zhen-qiang Qi, Shen-min Song, Zhao-hua Yang, Guang...