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» Application of Saluja-Karpovsky Compactors to Test Responses...
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VTS
2003
IEEE
104views Hardware» more  VTS 2003»
13 years 11 months ago
Application of Saluja-Karpovsky Compactors to Test Responses with Many Unknowns
This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detectio...
Janak H. Patel, Steven S. Lumetta, Sudhakar M. Red...
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
14 years 6 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
SADM
2010
141views more  SADM 2010»
13 years 11 days ago
A parametric mixture model for clustering multivariate binary data
: The traditional latent class analysis (LCA) uses a mixture model with binary responses on each subject that are independent conditional on cluster membership. However, in many pr...
Ajit C. Tamhane, Dingxi Qiu, Bruce E. Ankenman