In this paper we investigate and propose a fully automated technique to perform conformance checking of Java implementations against UML class diagrams. In our approach, we reused...
Abstract. The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric ver...
Vyacheslav N. Yarmolik, I. V. Bykov, Sybille Helle...
The detection of cell stability and data retention faults in SRAMs has been a time consuming process. In this paper we discuss a new design for test technique called Weak Write Tes...
—Conventional testing methods often fail to detect hidden flaws in complex embedded software such as device drivers or file systems. This deficiency incurs significant developmen...
Abstract. We propose a syntax-driven test generation technique to auly derive abstract test cases from a set of requirements expressed in a linear temporal logic. Assuming that an ...