7 search results - page 1 / 2 » Arbitrary-Precision Signal Generation for Bandlimited Mixed-... |
ITC
1995
IEEE
13 years 8 months ago
1995
IEEE
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ETS
2006
IEEE
13 years 11 months ago
2006
IEEE
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...