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» Automated Modeling of Custom Digital Circuits for Test
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AMOST
2007
ACM
13 years 9 months ago
Using LTL rewriting to improve the performance of model-checker based test-case generation
Model-checkers have recently been suggested for automated software test-case generation. Several works have presented methods that create efficient test-suites using model-checker...
Gordon Fraser, Franz Wotawa
MM
2006
ACM
189views Multimedia» more  MM 2006»
13 years 11 months ago
Real-time computerized annotation of pictures
Automated annotation of digital pictures has been a highly challenging problem for computer scientists since the invention of computers. The capability of annotating pictures by c...
Jia Li, James Ze Wang
KDD
2007
ACM
182views Data Mining» more  KDD 2007»
14 years 6 months ago
Cleaning disguised missing data: a heuristic approach
In some applications such as filling in a customer information form on the web, some missing values may not be explicitly represented as such, but instead appear as potentially va...
Ming Hua, Jian Pei
JPDC
2000
141views more  JPDC 2000»
13 years 5 months ago
A System for Evaluating Performance and Cost of SIMD Array Designs
: SIMD arrays are likely to become increasingly important as coprocessors in domain specific systems as architects continue to leverage RAM technology in their design. The problem ...
Martin C. Herbordt, Jade Cravy, Renoy Sam, Owais K...