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» Automated Modeling of Custom Digital Circuits for Test
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MJ
2007
119views more  MJ 2007»
13 years 4 months ago
Automated energy calculation and estimation for delay-insensitive digital circuits
With increasingly smaller feature sizes and higher on-chip densities, the power dissipation of VLSI systems has become a primary concern for designers. This paper first describes...
Venkat Satagopan, Bonita Bhaskaran, Anshul Singh, ...
ICCAD
2001
IEEE
104views Hardware» more  ICCAD 2001»
14 years 2 months ago
A Symbolic Simulation-Based Methodology for Generating Black-Box Timing Models of Custom Macrocells
We present a methodology for generating black-box timing models for full-custom transistor-level CMOS circuits. Our approach utilizes transistor-level ternary symbolic timing simu...
Clayton B. McDonald, Randal E. Bryant
VTS
1999
IEEE
68views Hardware» more  VTS 1999»
13 years 9 months ago
A Test Point Insertion Algorithm for Mixed-Signal Circuits
This paper presents an algorithm based on testability measurement for test point insertion of mixed-signal circuits. Two transfer function models compatible with analog models are...
Jinyan Zhang, Sam D. Huynh, Mani Soma
ITC
1995
IEEE
122views Hardware» more  ITC 1995»
13 years 8 months ago
A Fault Model and a Test Method for Analog Fuzzy Logic Circuits
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
Stefan Weiner
ICCAD
1997
IEEE
137views Hardware» more  ICCAD 1997»
13 years 9 months ago
Optimization techniques for high-performance digital circuits
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...
Chandramouli Visweswariah