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15

VTS
1999
IEEE

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A Test Point Insertion Algorithm for Mixed-Signal Circuits

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A Test Point Insertion Algorithm for Mixed-Signal Circuits

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This paper presents an algorithm based on testability measurement for test point insertion of mixed-signal circuits. Two transfer function models compatible with analog models are proposed: one is for digital devices and the other is for A/D interface components. An industry power supply circuit and a common A/D converter circuit are used to validate our approaches.

Jinyan Zhang, Sam D. Huynh, Mani Soma

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Added	04 Aug 2010
Updated	04 Aug 2010
Type	Conference
Year	1999
Where	VTS
Authors	Jinyan Zhang, Sam D. Huynh, Mani Soma

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