5 search results - page 1 / 1 » Automated Testability Enhancements for Logic Brick Libraries |
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Circuit fabrics composed of highly regular structures, called logic bricks, have been described recently for improving yield. An automated logic brick design flow based on a SAT ...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
Implementing logic blocks in an integrated circuit in terms of repeating or regular geometry patterns [6,7] can provide significant advantages in terms of manufacturability and de...
CADE
2006
Springer
14 years 5 months ago
2006
Springer
In this paper we introduce several new improvements to the bottom-up model generation (BUMG) paradigm. Our techniques are based on non-trivial transformations of first-order probl...
DAC
2005
ACM
14 years 5 months ago
2005
ACM
Input vector control (IVC) technique utilizes the stack effect in CMOS circuit to apply the minimum leakage vector (MLV) to the circuit at the sleep mode to reduce leakage. Additi...
DAC
2006
ACM
13 years 6 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...