41 search results - page 2 / 9 » Automatic Generation of Synchronous Test Patterns for Asynch... |
ICCAD
1997
IEEE
13 years 9 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
We describe a technique to generate critical hazard-free tests for self-timed control circuits build using a macromodule library, in a partial scan based DFT environment. Wepropos...
ICCAD
2004
IEEE
14 years 2 months ago
2004
IEEE
ITC
1994
IEEE
13 years 8 months ago
1994
IEEE
ICTAI
1994
IEEE
13 years 8 months ago
1994
IEEE