42 search results - page 9 / 9 » Automatic Test Pattern Generation for Resistive Bridging Fau... |
IOLTS
2008
IEEE
14 years 11 days ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
DT
2000
13 years 5 months ago
2000
Effective high-level ATPG tools are increasingly needed, as an essential element in the quest for reducing as much as possible the designer work on gate-level descriptions. We pro...