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» Automating the CAD CAE dimensional reduction process
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DAC
2006
ACM
14 years 5 months ago
Standard cell characterization considering lithography induced variations
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
Ke Cao, Sorin Dobre, Jiang Hu
ICASSP
2010
IEEE
13 years 5 months ago
Swift: Scalable weighted iterative sampling for flow cytometry clustering
Flow cytometry (FC) is a powerful technology for rapid multivariate analysis and functional discrimination of cells. Current FC platforms generate large, high-dimensional datasets...
Iftekhar Naim, Suprakash Datta, Gaurav Sharma, Jam...
DAC
2004
ACM
14 years 5 months ago
Toward a methodology for manufacturability-driven design rule exploration
Resolution enhancement techniques (RET) such as optical proximity correction (OPC) and phase-shift mask (PSM) technology are deployed in modern processes to increase the fidelity ...
Luigi Capodieci, Puneet Gupta, Andrew B. Kahng, De...
GRC
2010
IEEE
13 years 5 months ago
Learning Multiple Latent Variables with Self-Organizing Maps
Inference of latent variables from complicated data is one important problem in data mining. The high dimensionality and high complexity of real world data often make accurate infe...
Lili Zhang, Erzsébet Merényi
DAC
2007
ACM
14 years 5 months ago
Beyond Low-Order Statistical Response Surfaces: Latent Variable Regression for Efficient, Highly Nonlinear Fitting
The number and magnitude of process variation sources are increasing as we scale further into the nano regime. Today's most successful response surface methods limit us to lo...
Amith Singhee, Rob A. Rutenbar