25 search results - page 5 / 5 » Automating the development of Shipyard manufacturing models |
WETICE
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper describes the architecture and concept of operation of a Framework for Adaptive Process Modeling and Execution (FAME). The research addresses the absence of robust meth...
DAC
2007
ACM
13 years 9 months ago
2007
ACM
This paper presents a statistical framework to cooperatively design and develop technology, product circuit, benchmarking and model early in the development stage. The statistical...
DAC
2004
ACM
14 years 6 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
DAC
2006
ACM
13 years 7 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
BMCBI
2008
13 years 5 months ago
2008
Background: A survey of microarray databases reveals that most of the repository contents and data models are heterogeneous (i.e., data obtained from different chip manufacturers)...