Partially depleted silicon-on-insulator (PD-SOI) has emerged as a technology of choice for high-performance low-power deep-submicrometer digital integrated circuits. An important c...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Accurate estimation of the tick length of a synchronous program is essential for efficient and predictable implementations that are devoid of timing faults. The techniques to dete...
Partha S. Roop, Sidharta Andalam, Reinhard von Han...