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TCAD
2008
172views more  TCAD 2008»
13 years 5 months ago
General Methodology for Soft-Error-Aware Power Optimization Using Gate Sizing
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
Foad Dabiri, Ani Nahapetian, Tammara Massey, Miodr...
KBSE
2005
IEEE
13 years 11 months ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...