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DAC
2008
ACM
14 years 5 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
PVM
2005
Springer
13 years 10 months ago
Calculation of Single-File Diffusion Using Grid-Enabled Parallel Generic Cellular Automata Simulation
Parallel execution of simulation runs has become indispensable in different research areas recently. One of the most promising and powerful models in science are cellular automata ...
Marcus Komann, Christian Kauhaus, Dietmar Fey
ISQED
2011
IEEE
398views Hardware» more  ISQED 2011»
12 years 8 months ago
Switching constraint-driven thermal and reliability analysis of Nanometer designs
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
Srini Krishnamoorthy, Vishak Venkatraman, Yuri Apa...
EUROMICRO
2000
IEEE
13 years 9 months ago
Reliability Analysis of a Self-Repairing Embryonic Machine
The embryonics project proposes a family of cellular architectures with reconfiguration properties inspired by the ontogenesis of multicellular organisms. This paper proposes relia...
Cesar Ortega-Sanchez, Andrew M. Tyrrell, Daniel Ma...
COMPSAC
2002
IEEE
13 years 9 months ago
Reliability Assessment of WEB Applications
The paper discusses a formal approach for specifying time-dependent Web applications and proposes a Markov model for reliability prediction. Measures for predicting reliability ar...
Vangalur S. Alagar, Olga Ormandjieva