24 search results - page 1 / 5 » Characterization and Parameterized Random Generation of Digi... |
DAC
1996
ACM
13 years 9 months ago
1996
ACM
The development of new Field-Programmed, MaskProgrammed and Laser-Programmed Gate Array architectures is hampered by the lack of realistic test circuits that exercise both the arc...
TCAD
1998
13 years 4 months ago
1998
FPGA
1997
ACM
13 years 9 months ago
1997
ACM
Programmable logic architectures increase in capacity before commercial circuits are designed for them, yielding a distinct problem for FPGA vendors: how to test and evaluate the ...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
CEC
2003
IEEE
13 years 8 months ago
2003
IEEE
Evolutionary computation presents a new paradigm shift in hardware design and synthesis. According to this paradigm, hardware design is pursued by deriving inspiration from biologi...