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» Characterizing cloud computing hardware reliability
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DAC
2006
ACM
14 years 6 months ago
Standard cell characterization considering lithography induced variations
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
Ke Cao, Sorin Dobre, Jiang Hu
ICCAD
2003
IEEE
152views Hardware» more  ICCAD 2003»
14 years 2 months ago
Dynamic Fault-Tolerance and Metrics for Battery Powered, Failure-Prone Systems
Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential for runtime failure. Such failures range from intermittent electrical and mechan...
Phillip Stanley-Marbell, Diana Marculescu
CVPR
2009
IEEE
13 years 9 months ago
Automatic registration of LIDAR and optical images of urban scenes
Fusion of 3D laser radar (LIDAR) imagery and aerial optical imagery is an efficient method for constructing 3D virtual reality models. One difficult aspect of creating such models...
Andrew Mastin, Jeremy Kepner, John W. Fisher III
FAST
2010
13 years 7 months ago
Panache: A Parallel File System Cache for Global File Access
Cloud computing promises large-scale and seamless access to vast quantities of data across the globe. Applications will demand the reliability, consistency, and performance of a t...
Marc Eshel, Roger L. Haskin, Dean Hildebrand, Mano...
BMCBI
2008
128views more  BMCBI 2008»
13 years 5 months ago
Efficient computation of absent words in genomic sequences
Background: Analysis of sequence composition is a routine task in genome research. Organisms are characterized by their base composition, dinucleotide relative abundance, codon us...
Julia Herold, Stefan Kurtz, Robert Giegerich