4 search results - page 1 / 1 » Characterizing the Effects of Transient Faults on a High-Per... |
DSN
2004
IEEE
13 years 8 months ago
2004
IEEE
The progression of implementation technologies into the sub-100 nanometer lithographies renew the importance of understanding and protecting against single-event upsets in digital...
FDTC
2011
Springer
12 years 4 months ago
2011
Springer
Abstract—The literature about fault analysis typically describes fault injection mechanisms, e.g. glitches and lasers, and cryptanalytic techniques to exploit faults based on som...
MICRO
2007
IEEE
13 years 11 months ago
2007
IEEE
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...
ISPASS
2007
IEEE
13 years 11 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...