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DATE
2008
IEEE
91views Hardware» more  DATE 2008»
14 years 14 days ago
Fault Clustering in deep-submicron CMOS Processes
The fraction of ICs that pass all production tests but fail in the application is called the defect level. Defect levels depend on the average number of defects per IC, and also o...
Jan Schat
IWPC
1996
IEEE
13 years 10 months ago
Evaluating process clusters to support automatic program understanding
Evaluating the design of a distributed application is di cult but provides useful information for program development and maintenance. In distributed debugging, for example, proce...
Thomas Kunz
CJ
1998
118views more  CJ 1998»
13 years 5 months ago
Least-Squares Structuring, Clustering and Data Processing Issues
Approximation structuring clustering is an extension of what is usually called square-error clustering" onto various cluster structures and data formats. It appears to be not...
Boris Mirkin
INFSOF
2007
101views more  INFSOF 2007»
13 years 5 months ago
Clustering large software systems at multiple layers
Software clustering algorithms presented in the literature rarely incorporate in the clustering process dynamic information, such as the number of function invocations during runt...
Bill Andreopoulos, Aijun An, Vassilios Tzerpos, Xi...
ICPR
2008
IEEE
14 years 13 days ago
Scale-invariant density-based clustering initialization algorithm and its application
In this paper, we bring out a new density-based clustering initialization algorithm which is invariant to the scale factor. Instead of using the scale factor while the cluster ini...
Chunsheng Hua, Ryusuke Sagawa, Yasushi Yagi