18 search results - page 3 / 4 » Coefficient-based parametric faults detection in analog circ... |
ICCAD
2000
IEEE
13 years 10 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault simulation, the proposed approach calculates indirectly from the simulator output the set...
ICCAD
1991
IEEE
13 years 9 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
EH
2000
IEEE
13 years 10 months ago
2000
IEEE
Evolvable Hardware (EHW) refers to HW design and selfreconfiguration using evolutionary/genetic mechanisms. The paper presents an overview of some key concepts of EHW, describing ...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
In this paper, we present an innovative methodology to estimate and improve the quality of analog and mixed-signal circuit testing. We first detect and reduce the redundancy in th...