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» Combining Metric Features in Large Collections
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DT
2000
88views more  DT 2000»
13 years 5 months ago
Postsilicon Validation Methodology for Microprocessors
f abstraction as applicable to break the problem's complexity, and innovating better techniques to address complexity of new microarchitectural features. Validation techniques...
Hemant G. Rotithor
TMM
2010
135views Management» more  TMM 2010»
13 years 2 days ago
Image Classification With Kernelized Spatial-Context
Abstract--The goal of image classification is to classify a collection of unlabeled images into a set of semantic classes. Many methods have been proposed to approach this goal by ...
Guo-Jun Qi, Xian-Sheng Hua, Yong Rui, Jinhui Tang,...
KBSE
2007
IEEE
13 years 11 months ago
Context-aware statistical debugging: from bug predictors to faulty control flow paths
Effective bug localization is important for realizing automated debugging. One attractive approach is to apply statistical techniques on a collection of evaluation profiles of pr...
Lingxiao Jiang, Zhendong Su