In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
The Range Minimum Query (RMQ) Problem is to preprocess an array A of length n in O(n) time such that subsequent on-line queries asking for the position of a minimal element between...
Johannes Fischer, Volker Heun, Horst Martin St&uum...
As XML database sizes grow, the amount of space used for storing the data and auxiliary data structures becomes a major factor in query and update performance. This paper presents...
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...